Magnetic force microscopy imaging of in-plane magnetic field gradient using transient oscillation
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2844709
Reference4 articles.
1. Magnetic force microscopy: General principles and application to longitudinal recording media
2. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
3. Principle of magnetic field analysis by MFM signal transformation and its application to magnetic recording media
4. Magnetic reversal field map combined with medium noise analysis in CoCrPt–SiO2 granular perpendicular recording medium
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2. Quantitative analysis of the magnetic domain structure in polycrystalline La0.7Sr0.3MnO3thin films by magnetic force microscopy;Phys. Chem. Chem. Phys.;2013
3. Magnetic force microscopy sensors providing in-plane and perpendicular sensitivity;Applied Physics Letters;2012-09-10
4. Simultaneous magnetic force microscopy imaging of perpendicular and in-plane magnetic field gradient on La0.7Sr0.3MnO3 granular film with in-plane magnetization;Journal of Applied Physics;2011-04
5. MFM analysis of magnetic inhomogeneity in recorded area for perpendicular magnetic recording media by simultaneous imaging of perpendicular and in-plane magnetic field gradient;Journal of Physics: Conference Series;2011-01-01
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