An X‐Ray Method for Measuring the Thickness of Thin Crystalline Films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1707656
Reference6 articles.
1. Bonding and Structural Variations of Commercial Electroplatings 2–55×10−6Inch Thick
2. The influence of absorption on the shapes and positions of lines in debye-scherrer powder photographs
3. The Absorption Displacement in X‐Ray Diffraction by Cylindrical Samples
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4. Thickness Measurement of Gold Deposits;Circuit World;1975-01
5. A Review of X-Ray Methods for Investigating Thin Films And Platings;Physical Measurement and Analysis of Thin Films;1969
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