A multisample, high‐intensity Cs sputter negative ion source for accelerator mass spectrometry applications
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1142915
Reference4 articles.
1. A versatile high intensity negative ion source
2. The AMS system at the Shanghai Institute of Nuclear Research
3. Status of the tandem accelerator mass spectrometry facility at Peking University
4. Design criteria on a minicyclotron as a mass spectrometer for dating
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3. Single-electron detachment cross sections for negative ions of transition elements colliding with gases;Atomic Data and Nuclear Data Tables;2007-07
4. Electron Detachment for Collisions of Intermediate Energy Cu-and Ag-with He;Japanese Journal of Applied Physics;2001-10-15
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