A new Cs sputter ion source for accelerator mass spectrometry-Reference-Cited by-同舟云学术

A new Cs sputter ion source for accelerator mass spectrometry

Published:1992-04 Issue:4 Volume:63 Page:2469-2471
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Höpfl R.,Bretschneider T.,Buchler A.,Charasse Y.,Ernst W.,Finckh E.,Goblirsch R.,Gumbmann F.,Haller M.,Karschnick R.,Kretschmer W.,Rauscher A.,Schielein H.,Schleicher M.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1142914

Reference4 articles.

1. A new AMS facility in Erlangen — status and first results

2. A new AMS facility in Erlangen — status and first results

3. Formation of negative ions in Cs sputter sources

4. The inverted spherical ioniser sputter ion source (IS3)

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A review of diagnostic techniques for high-intensity negative ion sources;Applied Physics Reviews;2021-06

2. New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications;Review of Scientific Instruments;2007-08

3. The Erlangen AMS facility: status report and research program;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-03

4. The Erlangen AMS Facility and its Applications in 14C Sediment and Bone Dating;Radiocarbon;1997

5. Trace Analysis of the Radionuclides90Sr and89Sr in Environmental Samples II: Accelerator Mass Spectrometry(AMS);Angewandte Chemie International Edition in English;1995-02-03