Structural and electrical characterization of polycrystalline NbO2 thin film vertical devices grown on TiN-coated SiO2/Si substrates
Author:
Affiliation:
1. Department of Physics, University of California Santa Cruz, Santa Cruz, California 95064, USA
2. Department of Physics, Loughborough University, Loughborough LE11 3TU, United Kingdom
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5038837
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1. Oxides Which Show a Metal-to-Insulator Transition at the Neel Temperature
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5. Coupling dynamics of Nb/Nb2O5relaxation oscillators
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