Rietveld analysis using powder diffraction data with anomalous scattering effect obtained by focused beam flat sample method
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Reference15 articles.
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Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Development of a new methodology for site distribution determination by powder diffraction with anomalous scattering using focused beam and flat shape sample geometry;Journal of Physics: Conference Series;2022-12-01
2. In-depth investigations of size and occupancies in cobalt ferrite nanoparticles by joint Rietveld refinements of X-ray and neutron powder diffraction data;Journal of Applied Crystallography;2022-10-01
3. Optical and structural investigations on titanium oxynitride films for visible-UV photocatalytic applications;Journal of Applied Physics;2020-04-07
4. A trial for distinguish of Mn3+ and Mn4+ ions in LiMn2O4 by anomalous powder x-ray diffraction with focused beam flat sample method;AIP Conference Proceedings;2019
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