Monitoring of the heavy-ion beam distribution using poly- and monochromatic x-ray fluorescence imaging

Author:

Zähter Ş.12ORCID,Rosmej O. N.12ORCID,Beloiu P.2,Bogdanov A.3ORCID,Golubev A.345ORCID,Gyrdymov M.2,Jacoby J.2,Kantsyrev A.3ORCID,Loetzsch R.6,Nicolai M.2,Panyushkin V.3,Skobliakov A.3,Tavana P. M.26,Uschmann I.6ORCID,Zahn N.2,Spielmann C.6ORCID

Affiliation:

1. GSI Helmholtzzentrum für Schwerionenforschung, Planckstraße 1, 64291 Darmstadt, Germany

2. Institute for Applied Physics, Goethe University Frankfurt, Max-von-Laue Straße 1, 60438 Frankfurt, Germany

3. Institute for Theoretical and Experimental Physics Named by A.I. Alikhanov of National Research Centre Kurchatov Institute, 25 Bol'shaya Cheremushkinskaya str., 117218 Moscow, Russia

4. Private Institution “Science and Innovation” SC “Rosatom,” 115035 Moscow, Russia

5. JSC “NIITFA“ SC “Rosatom,” 46 Shosse Varshavskoe, 115230 Moscow, Russia

6. Institute for Optics and Quantum Electronics, Friedrich-Schiller-University, Max-Wien-Platz 1, 07743 Jena, Germany

Abstract

In this work, the first proof of the principal of an in situ diagnostics of the heavy-ion beam intensity distribution in irradiation of solid targets is proposed. In this scheme, x-ray fluorescence that occurs in the interaction of heavy-ions with target atoms is used for imaging purposes. The x-ray conversion to optical radiation and a transport-system was developed, and its first test was performed in experiments at the Universal Linear Accelerator in Darmstadt, Germany. The Au-beam intensity distribution on thin foils and Cu-mesh targets was imaged using multiple x-ray pinholes (polychromatic imaging) and 2D monochromatic imaging of Cu Kα radiation by using a toroidally bent silicon crystal. The presented results are of importance for application in experiments on the investigation of the equation of states of high energy density matter using high intensity GeV/u heavy-ion beams of ≥1010 particles/100 ns.

Funder

Bundesministerium für Bildung und Forschung

Ministry of Science and Higher Education of the Russian Federation

Publisher

AIP Publishing

Subject

Instrumentation

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