Aspects of negative‐ion generation and extraction from a refocus geometry cesium sputter negative‐ion source. II-Reference-Cited by-同舟云学术

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Aspects of negative‐ion generation and extraction from a refocus geometry cesium sputter negative‐ion source. II

Published:1988-07 Issue:7 Volume:59 Page:1045-1052
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Alton G. D.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1139777

Reference18 articles.

1. A versatile high intensity negative ion source

2. An axial geometry cesium sputter negative ion source with continuous tungsten surface ionizer

3. Negative Ion Sources Equipped with Continuous Annular and Spherical Geometry Surface Ionizers

4. A survey of negative ion sources for tandem accelerators

5. Preliminary Evaluation of a Modified Mueller-Hortig Geometry Negative Ion Source Using a Negative Ion Source Test Facility

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Combined scanning force and friction microscopy of mica;Nanotechnology;1990-10-01

2. Experimental determination of a species-dependent effect in the transverse emittances of sputter-generated negative-ion beams;Physical Review B;1990-02-01

3. Species dependence of the emittances of sputter-generated negative ion beams;Journal of Physics D: Applied Physics;1989-04-14

4. Characterization of a cesium surface ionization source with a porous tungsten ionizer. I;Review of Scientific Instruments;1988-07

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