The mapping of technological texture in electrical insulators

Author:

Kozík T.,Minárik S.,Ševčík M.,Kubliha M.,Kuna P.,Arras P.,Bošák O.

Publisher

AIP Publishing

Reference15 articles.

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3. Grain-Boundary Resistance and Nonlinear Coefficient Correlation for SnO2-Based Varistors

4. Subgrain Structures Characterized by Electron Backscatter Diffraction (EBSD)

5. Application of electron backscatter diffraction to the study on orientation distribution of intermetallic compounds at heterogeneous interfaces (Sn/Ag and Sn/Cu)

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