A method for measuring electron temperature and ion density with immunity to RF fluctuation and ion current

Author:

Eo Hyundong1ORCID,Kim Kyung-Hyun1,Lee Moo-Young2,Kim Ju Ho1ORCID,Chung Chin-Wook1ORCID

Affiliation:

1. Department of Electrical Engineering, Hanyang University 1 , Seoul 133-791, Republic of Korea

2. Department of Nanoscale Semiconductor University, Hanyang University 2 , Seoul 133-791, Republic of Korea

Abstract

A measurement method immune to radio frequency (RF) fluctuations is proposed for obtaining electron temperature and plasma density in RF discharges. The self-bias voltage formed by applying a square voltage to a floating planar probe and its fundamental frequency current are measured to obtain electron temperature and plasma density. To investigate the change in electron temperature due to RF distortion, the case with and without RF filters is compared, and our method is least affected by RF fluctuations compared to the conventional methods: electron energy probability function (EEPF) and floating harmonic method (FHM). When the RF powers and the gas pressures change, the electron temperature and the ion density measured from our method agree well with those measured from the FHM. Although our method and the EEPF are slightly different due to the depletion of the EEPF at high energy (near the floating potential), the trends of the three methods (our method, FHM, and EEPF) agree well under all conditions. In our method, the electron temperature was investigated with and without correction for the increase in the ion current at probe tip radii of 5 and 1 mm. When correcting the increase in ion current due to the sheath expansion, the electron temperature is not overestimated and does not change in the planar probe with a small radius. This can be useful in plasma monitoring system where an RF filter cannot be installed, or the probe tip must be made small.

Funder

Ministry of Trade, Industry and Energy

Korea Semiconductor Research Consortium

National Research Foundation of Korea

Publisher

AIP Publishing

Subject

Condensed Matter Physics

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3