1. Hot-electron-induced photon and photocarrier generation in Silicon MOSFET's
2. Picosecond hot electron light emission from submicron complementary metal–oxide–semiconductor circuits
3. Dynamic internal testing of CMOS circuits using hot luminescence
4. C. Anderson, J. Petrovick, J. M. Keaty, J. Warnock, G. Nussbaum, J. M. Tendier, C. Carter, S. Chu, J. Clabes, J. DiLullo, P. Dudley, P. Harvey, B. Krauter, J. LeBlanc, Pong-Fei Lu, B. McCredie, G. Plum, P. J. Restle, S. Runyon, M. Scheuermann, S. Schmidt, J. Wagoner, R. Weiss, S. Weitzel, and B. Zoric, in IEEE International Solid-State Circuits Conference (2001), pp. 232–233.
5. P. Smeys, V. McGahay, I. Yang, J. Adkisson, K. Beyer, O. Bula, Z. Chen, B. Chu, J. Culp, S. Das, A. Eckert, L. Hadel, M. Hargrove, J. Herman, L. Lin, R. Mann, E. Maciejewski, S. Narasimha, P. O'Neil, S. Rauch, D. Ryan, J. Toomey, L. Tsou, P. Varekamp, R. Wachnik, T. Wagner, S. Wu, C. Yu, P. Agnello, J. Connolly, S. Crowder, C. Davis, R. Ferguson, A. Sekiguchi, L. Su, R. Goldblatt, and T. C. Chen, in Symposium on VLSI Technology (2000), pp. 184–185.