Two-probe atomic-force microscope manipulator and its applications-Reference-Cited by-同舟云学术

Two-probe atomic-force microscope manipulator and its applications

Published:2017-06 Issue:6 Volume:88 Page:063701
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Zhukov A. A.¹^ORCID,Stolyarov V. S.¹²^ORCID,Kononenko O. V.³⁴^ORCID

Affiliation:

1. Institute of Solid State Physics, Russian Academy of Science, Chernogolovka 142432, Russia

2. Moscow Institute of Physics and Technology (MIPT), State University, 9 Institutskiy per., Dolgoprudny, Moscow Region 141700, Russia

3. Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences, 6, Academician Ossipyan str., Chernogolovka, Moscow Region 142432, Russia

4. National University of Science and Technology “MISiS,” 4, Leninsky pr., Moscow 119049, Russia

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4985006

Reference22 articles.

1. Spin relaxation in InAs nanowires studied by tunable weak antilocalization

2. Electrically conductive bacterial nanowires produced by Shewanella oneidensis strain MR-1 and other microorganisms

3. SU(2) and SU(4) Kondo effects in carbon nanotube quantum dots

4. Diameter-Dependent Electron Mobility of InAs Nanowires

5. Diameter-dependent conductance of InAs nanowires

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