Optical second‐harmonic reflection from polycrystalline silicon and its relation to grain boundaries
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.110864
Reference8 articles.
1. Electrical Properties of Polycrystalline-Silicon Thin Films for VLSI
2. Surface properties probed by second-harmonic and sum-frequency generation
3. Surface studies by optical second harmonic generation: An overview
4. Second-Harmonic Reflection from Silicon Surfaces and Its Relation to Structural Symmetry
5. Inhomogeneous deformation of silicon surface layers probed by second-harmonic generation in reflection
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1. Second Harmonic Rotational Anisotropy of Polycrystalline Fe Films on Glass Substrates;Journal of the Korean Magnetics Society;2009-04-30
2. Deposition and Characterization of Polycrystalline Silicon Thin-Films by Reactive Thermal Chemical Vapour Deposition at 450°C;Solid State Phenomena;2003-06
3. The quantum damped harmonic oscillator;Physics Reports;2002-05
4. Quantum analysis of the susceptibility for identical atoms subjected to an external force with a tail;Physical Review A;1996-10-01
5. Analysis of second-harmonic generation by unamplified, high-repetition-rate, ultrashort laser pulses at Si(001) interfaces;IEEE Journal of Selected Topics in Quantum Electronics;1995
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