Spatial analysis of electronic noise in submicron semiconductor structures
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.109705
Reference5 articles.
1. Application of Monte Carlo techniques to hot carrier diffusion noise calculation in unipolar semiconducting components
2. Noise and correlation functions of hot carriers in semiconductors
3. Noise in single injection diodes. I. A survey of methods
4. Current and number fluctuations in submicron n+nn+ structures
5. Monte Carlo analysis of the transient spectral density of velocity fluctuations in semiconductors
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