About the relevance of defect features in as-cut multicrystalline silicon wafers on solar cell performance

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Kovvali Aditya,Demant Matthias,Trötschler Theresa,Haunschild Jonas,Rein Stefan

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Reference11 articles.

1. I. VDMA, ITRPV1– 62 (2017).

2. T. Luka, C. Hagendorf, and M. Turek, Photovoltaics International 1–6 (2016).

3. Photoluminescence imaging of silicon wafers

4. Quality control of as-cut multicrystalline silicon wafers using photoluminescence imaging for solar cell production

5. T. Trupke, R. A. Bardos, M. D. Abbott, F. w. Chen, J. E. Cotter, and A. Lorenz, “Fast photoluminescence imaging of silicon wafers,” in 2006 IEEE 4th World Conference on Photovoltaic Energy Conference, Vol. 1 (2006), pp. 928–931.

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3. Three-dimensional model of a multicrystalline silicon ingot based on wafer photoluminescent images;SiliconPV 2021, The 11th International Conference on Crystalline Silicon Photovoltaics;2022

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