Structural depth profiling of iron oxide thin films using grazing incidence asymmetric Bragg x‐ray diffraction
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.343230
Reference14 articles.
1. X-ray depth profiling of iron oxide thin films
2. Analysis of cobalt-doped iron oxide thin films by synchrotron radiation
3. X‐ray characterization of surface and bulk structures of sputtered iron oxide thin film
4. Grazing incidence synchrotron x-ray diffraction method for analyzing thin films
5. High density recording characteristics of sputtered γ‐Fe2O3thin‐film disks
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