Precise total electron yield measurements for impact of singly or multiply charged ions on clean solid surfaces

Author:

Eder H.,Vana M.,Aumayr F.,Winter H. P.

Publisher

AIP Publishing

Subject

Instrumentation

Cited by 31 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. The charge exchange of slow highly charged ions at surfaces unraveled with freestanding 2D materials;Surface Science Reports;2022-11

2. Assessing electron emission induced by pulsed ion beams: A time-of-flight approach;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-09

3. Electron-emission processes in highly charged Ar and Xe ions impinging on highly ordered pyrolytic graphite at energies just above the kinetic threshold;Physical Review A;2014-11-06

4. An ultra-compact setup for measuring ion-induced electron emission statistics;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-12

5. Coulomb explosion of diatomic molecules in intense XUV fields mapped by partial covariance;Journal of Physics B: Atomic, Molecular and Optical Physics;2013-08-13

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