A method to correct hysteresis of scanning probe microscope images based on a sinusoidal model
Author:
Affiliation:
1. School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China
Funder
National Natural Science Foundation of China
Natural Science Foundation of Anhui Province
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5052281
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