Test of negative ion beams from a microwave ion source with a charge exchange canal for accelerator mass spectrometry applications
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1430517
Reference6 articles.
1. Hold-up and memory effect for carbon in a compact microwave ion source
2. Target Preparation for Continuous Flow Accelerator Mass Spectrometry
3. Tests of positive ion beams from a microwave ion source for AMS
4. Test of positive ion beams from a microwave ion source for AMS
5. A compact high-current microwave-driven ion source
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