Defect and grain boundary scattering in tungsten: A combined theoretical and experimental study-Reference-Cited by-同舟云学术

Defect and grain boundary scattering in tungsten: A combined theoretical and experimental study

Published:2018-04-21 Issue:15 Volume:123 Page:154303
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Lanzillo Nicholas A.¹,Dixit Hemant²,Milosevic Erik³,Niu Chengyu³,Carr Adra V.¹,Oldiges Phil¹,Raymond Mark V.³,Cho Jin³,Standaert Theodorus E.¹,Kamineni Vimal K.³

Affiliation:

1. IBM Research at Albany Nanotech, 257 Fuller Road, Albany, New York 12203, USA

2. GLOBALFOUNDRIES, Engineering Private Limited, 9th Floor, Block N1, Manyata Embassy Business Park, Bangalore 560045, India

3. GLOBALFOUNDRIES at Albany Nanotech, 257 Fuller Road, Albany, New York 12203, USA

Funder

International Business Machines Corporation

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5027093

Reference33 articles.

1. Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces

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