In situcorrection of the spherical aberration in a double-toroidal electron analyzer-Reference-Cited by-同舟云学术

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In situcorrection of the spherical aberration in a double-toroidal electron analyzer

Published:2017-02 Issue:2 Volume:88 Page:023110
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Liu Xiao-Jing,Nicolas Christophe,Miron Catalin

Funder

National Natural Science Foundation of China

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4975379

Reference28 articles.

1. Angle-resolved measurements of the photoemission of electrons in the study of solids

2. Free clusters studied by core-level spectroscopies

3. Synchrotron‐Radiation‐Based Soft X‐Ray Electron Spectroscopy Applied to Structural and Chemical Characterization of Isolated Species, from Molecules to Nanoparticles

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-resolution electron time-of-flight spectrometers for angle-resolved measurements at the SQS Instrument at the European XFEL;Journal of Synchrotron Radiation;2022-04-01

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