DIRECT VIDEO IMAGING OF X‐RAY TOPOGRAPHS
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1652690
Reference26 articles.
1. Dislocation Reactions in Silicon Web‐Dendrite Crystals
2. Depth of Saw and Lap Damage in Germanium
3. Saw and Polishing Damage in Silicon Crystal Wafers by X‐Ray Topography
4. Dislocations in Silicon due to Localized Diffusion
5. X‐Ray Observations of Diffusion‐Induced Dislocations in Silicon
Cited by 19 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. TECHNIQUES AND INTERPRETATION IN X-RAY TOPOGRAPHY;Diffraction and Imaging Techniques in Material Science;1978
2. Direct Display of X-ray Topographic Images;Advances in X-ray Analysis;1977
3. Live topography;Topics in Applied Physics;1977
4. Characteristics of a channel plate as an image intensifier for X-ray topography;Journal of Applied Crystallography;1976-08-01
5. Lang camera for large scale X-ray transmission topography. (Nondestructive test method for Si wafer quality control);Journal of Physics E: Scientific Instruments;1976-08
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