PolLux: A new facility for soft x-ray spectromicroscopy at the Swiss Light Source-Reference-Cited by-同舟云学术

PolLux: A new facility for soft x-ray spectromicroscopy at the Swiss Light Source

Published:2008-11 Issue:11 Volume:79 Page:113704
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Raabe J.,Tzvetkov G.,Flechsig U.,Böge M.,Jaggi A.,Sarafimov B.,Vernooij M. G. C.,Huthwelker T.,Ade H.,Kilcoyne D.,Tyliszczak T.,Fink R. H.,Quitmann C.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3021472

Reference51 articles.

1. NEXAFS Spectroscopy

2. NEXAFS microscopy and resonant scattering: Composition and orientation probed in real and reciprocal space

3. X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92

4. Soft x‐ray microscopes

5. Interferometer-controlled scanning transmission X-ray microscopes at the Advanced Light Source

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