Experimental investigation of defect-assisted and intrinsic water vapor permeation through ultrabarrier films-Reference-Cited by-同舟云学术

Experimental investigation of defect-assisted and intrinsic water vapor permeation through ultrabarrier films

Published:2016-03 Issue:3 Volume:87 Page:033902
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Rev. Sci. Instrum.

Author:

Kim Hyungchul¹,Singh Ankit Kumar²,Wang Cheng-Yin³,Fuentes-Hernandez Canek³,Kippelen Bernard³,Graham Samuel¹²

Affiliation:

1. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332, USA

2. School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332, USA

3. School of Electrical and Computer Engineering, and Center for Organic Photonics and Electronics, Georgia Institute of Technology, Atlanta, Georgia 30332, USA

Funder

Bay Area Photovoltaics Consortium

Semiconductor Research Corporation (SRC)

U.S. Department of Energy (DOE)

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4942510

Reference21 articles.

1. Thin-Film Permeation-Barrier Technology for Flexible Organic Light-Emitting Devices

2. Materials and methods for encapsulation of OPV: A review

3. Moisture transport, adhesion, and corrosion protection of PV module packaging materials

4. A study of defects in ultra-thin transparent coatings on polymers

5. Defect-permeation correlation for ultrathin transparent barrier coatings on polymers

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