Finite element and analytical solutions for van der Pauw and four-point probe correction factors when multiple non-ideal measurement conditions coexist-Reference-Cited by-同舟云学术

Finite element and analytical solutions for van der Pauw and four-point probe correction factors when multiple non-ideal measurement conditions coexist

Published:2017-09 Issue:9 Volume:88 Page:094704
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Rev. Sci. Instrum.

Author:

Reveil Mardochee¹,Sorg Victoria C.¹,Cheng Emily R.¹^ORCID,Ezzyat Taha¹,Clancy Paulette¹,Thompson Michael O.²^ORCID

Affiliation:

1. Robert F. Smith School of Chemical and Biomolecular Engineering, Cornell University, Ithaca, New York 14853, USA

2. Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA

Funder

Colman Fellowship at Cornell University

GEM Fellowship

National Science Foundation (NSF)

Semiconductor Research Corporation (SRC)

Intel Foundation

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5001830

Reference18 articles.

1. L. J. van der Pauw, “A method of measuring specific resistivity and Hall effect of discs of arbitrary shape,” Philips Res. Rep. 13, 1 (1958).

2. Temperature-dependent thermal conductivities of CMOS layers by micromachined thermal van der Pauw test structures

3. On the van der Pauw’s method applied to the measurement of low thermal conductivity materials

4. Complete Characterization of Thermoelectric Materials by a Combined van der Pauw Approach

5. Efficient thermoelectric van der Pauw measurements

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