Weak localization and percolation effects in annealed In2O3-ZnO thin films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3635375
Reference24 articles.
1. Influence of DC magnetron sputtering parameters on the properties of amorphous indium zinc oxide thin film
2. Charge pumping method for photosensor application by using amorphous indium-zinc oxide thin film transistors
3. On the effect of Ti on the stability of amorphous indium zinc oxide used in thin film transistor applications
4. A microstructural study of low resistivity tin-doped indium oxide prepared by d.c. magnetron sputtering
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