An explanation for the anomalous impurity concentrations in Si as measured by the Hall effect
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.328848
Reference20 articles.
1. The doping concentrations of indium‐doped silicon measured by Hall,C‐V, and junction‐breakdown techniques
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3. A new acceptor level in indium‐doped silicon
4. Variation of Electrical Properties with Zn Concentration in GaP
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2. Carbon-containing heteroepitaxial silicon and silicon/germanium thin films on Si(001);Handbook of Thin Films;2002
3. Hole mobilities in pseudomorphic Si1−x−yGexCy alloy layers;Thin Solid Films;1998-12
4. Charge transport in strained Si1−yCy and Si1−x−yGexCy alloys on Si(001);Journal of Applied Physics;1997-11-15
5. Characterization of ZnSe:N Using Screening Effects;MRS Proceedings;1995
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