On-chip characterization of low-noise microstrip-coupled transition edge sensors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3097779
Reference20 articles.
1. Thermal conductance measurements for the development of ultra low-noise transition-edge sensors with a new method for measuring the noise equivalent power
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2. Low-temperature thermal conductances of amorphous dielectric microbridges in the diffusive to ballistic transition;Physical Review B;2011-05-09
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