Determination of residual stress in Cr‐implanted Al2O3by glancing angle x‐ray diffraction
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.107060
Reference20 articles.
1. Ion implantation and annealing of crystalline oxides
2. Effect of ion implantation on fracture stress of Al2O3
3. Mechanical property changes in sapphire by nickel ion implantation and their dependence on implantation temperature
4. Ion implantation in ceramics-residual stress and properties
5. An investigation of ion implantation-induced near-surface stresses and their effects in sapphire and glass
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