Impurity trapping and gettering in amorphous silicon
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.104721
Reference10 articles.
1. Determination of the energy barrier for structural relaxation in amorphous Si and Ge by Raman scattering
2. Effects of thermal annealing on the refractive index of amorphous silicon produced by ion implantation
3. Calorimetric evidence for structural relaxation in amorphous silicon
4. Homogeneous and interfacial heat releases in amorphous silicon
5. Point defect populations in amorphous and crystalline silicon
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