Continuous Ion Source for a Time‐of‐Flight Mass Spectrometer-Reference-Cited by-同舟云学术

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Continuous Ion Source for a Time‐of‐Flight Mass Spectrometer

Published:1963-12 Issue:12 Volume:34 Page:1367-1370
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Studier Martin H.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1718238

Reference1 articles.

1. THE CHEMISTRY OF URANIUM IN SURFACE IONIZATION SOURCES1

Cited by 44 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Tandem Reflectron Time-of-Flight Mass Spectrometer Utilizing Photodissociation;Analytical Chemistry;1995-11-01

2. On time focusing and phase space dynamics in time-of-flight mass spectrometer design;International Journal of Mass Spectrometry and Ion Processes;1994-03

3. Ion trapping and manipulation in a tandem time-of-flight-Fourier transform mass spectrometer;International Journal of Mass Spectrometry and Ion Processes;1991-02

4. Application of time array detection to capillary column gas chromatography/conventional time-of-flight mass spectrometry;Analytical Chemistry;1990-05-15

5. Mass dependence of time-lag focusing in time-of-flight mass spectrometry—an analysis;International Journal of Mass Spectrometry and Ion Processes;1990-04

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