Structures and properties of electron‐beam‐evaporated indium tin oxide films as studied by x‐ray photoelectron spectroscopy and work‐function measurements-Reference-Cited by-同舟云学术

Structures and properties of electron‐beam‐evaporated indium tin oxide films as studied by x‐ray photoelectron spectroscopy and work‐function measurements

Published:1993-05 Issue:9 Volume:73 Page:4344-4350
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Ishida T.,Kobayashi H.,Nakato Y.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.352818

Reference19 articles.

1. Highly Conductive, Transparent Films of Sputtered In[sub 2−x]Sn[sub x]O[sub 3−y]

2. Properties of Sn‐Doped In2 O 3 Films Prepared by RF Sputtering

3. Transparent conductive Sn‐doped indium oxide coatings deposited by reactive sputtering with a post cathode

4. Effects of heat treatment on the optical and electrical properties of indium–tin oxide films

5. The effect of ambient atmosphere in the annealing of indium tin oxide films

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