On the intensity of secondary Cu+, Cu+2, and Mo+ions as a function of bombarding ion energy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.328667
Reference7 articles.
1. Energy dependence of the secondary ion yield of metals and semiconductors
2. On the mechanism of cluster emission in sputtering
3. Developments in secondary ion mass spectroscopy and applications to surface studies
4. The oxidation of aluminum studied by sims at low energies
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1. A comparative study of primary ion energy dependence of secondary ion yields from Si and Ge surfaces under inert and reactive ion bombardment;Applied Surface Science;1995-02
2. Studies of bonding and valence states in YBa2Cu3O7−xthrough secondary‐ion‐mass spectrometry;Journal of Applied Physics;1993-03
3. SIMS of Y1Ba2Cu3O7−x and (Bi,Pb)2Sr2Ca2Cu3O10+δ superconductors;Vacuum;1992-03
4. Mechanism of production and the current density effects of doubly charged ion emission from Cd+-bombarded Nb and V targets;Radiation Effects and Defects in Solids;1991-07
5. Chemical enhancement of secondary ion emission from Cd+ ion bombarded Mo, Ti, Al and Cu surfaces;Journal of Nuclear Materials;1987-11
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