Method based on atomic photoionization for spot-size measurement on focused soft x-ray free-electron laser beams-Reference-Cited by-同舟云学术

Method based on atomic photoionization for spot-size measurement on focused soft x-ray free-electron laser beams

Published:2006-11-27 Issue:22 Volume:89 Page:221114
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Sorokin A. A.,Gottwald A.,Hoehl A.,Kroth U.,Schöppe H.,Ulm G.,Richter M.,Bobashev S. V.,Domracheva I. V.,Smirnov D. N.,Tiedtke K.,Düsterer S.,Feldhaus J.,Hahn U.,Jastrow U.,Kuhlmann M.,Nunez T.,Plönjes E.,Treusch R.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2397561

Reference14 articles.

1. Focusing multiple high-order harmonics in the extreme-ultraviolet and soft-x-ray regions by a platinum-coated ellipsoidal mirror

2. X-ray free-electron lasers

3. Multiple ionization of atom clusters by intense soft X-rays from a free-electron laser

4. Multiple Ionization of Rare Gas Atoms Irradiated with Intense VUV Radiation

5. Observation of Two-Photon Above-Threshold Ionization of Rare Gases by xuv Harmonic Photons

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