Thermal expansion measurement of pure aluminum using a very low thermal expansion heating stage for x-ray diffraction experiments-Reference-Cited by-同舟云学术

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Thermal expansion measurement of pure aluminum using a very low thermal expansion heating stage for x-ray diffraction experiments

Published:1999-08 Issue:8 Volume:70 Page:3413-3417
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Langelaan G.,Saimoto S.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1149928

Reference5 articles.

1. X-ray determination of the residual stresses in thin aluminum films deposited on silicon substrates

2. The influence of crystallographic texture on diffraction measurements of residual stress

3. The Variation of the Elastic Constants of Crystalline Aluminum with Temperature between 63°K and 773°K

4. The calibration of Debye-Scherrer X-ray powder cameras

5. A high temperature attachment for an X-ray diffractometer for precision lattice parameter measurements

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1. Grain Refinement of Cast Aluminum by Heterogeneous Nucleation Site Particles with High Lattice Matching;MATERIALS TRANSACTIONS;2023-06-01

2. Rate-Controlling Microplastic Processes during Plastic Flow in FCC Metals: Origin of the Variation of Strain Rate Sensitivity in Aluminum from 78 to 300 K;Crystals;2022-12-12

3. Self-assembly and in-situ characterization of Ti3C2T in Al: A step toward additive manufacturing of MXene-metal composites;Applied Materials Today;2022-06

4. Dislocation dynamics simulation of thermal annealing of a dislocation loop microstructure;Journal of Nuclear Materials;2022-04

5. Solubility Limit of Iron in Aluminum and Its Alloys: Role on Recrystallization, Grain Growth, Texture, and Interfacial Segregation Leading to Ductile Failure;Light Metals 2022;2022

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