Profile measurements of thin liquid films using reflectometry

Author:

Hanchak M. S.,Vangsness M. D.,Byrd L. W.,Ervin J. S.,Jones J. G.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Cited by 27 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Unveiling photon-driven nonlinear evaporation via liquid drop interferometry;Optics Letters;2024-07-17

2. Visualization of Liquid Surface Wave by Self-interference of Reflected Laser Beam with Artificial Neural Network;J IMAGING SCI TECHN;2024

3. Experimental investigation of thickness profile in an extended meniscus of thin film evaporation using reflectometry;Experimental Thermal and Fluid Science;2024-02

4. Magnetic-field induced flattening of evaporating ferro-nanofluid meniscus for enhanced cooling;International Journal of Heat and Mass Transfer;2024-01

5. Thickness Profile Measurement of a Nanofluid Thin Film Meniscus using Reflectometry;Proceeding of Proceedings of the 27th National and 5th International ISHMT-ASTFE Heat and Mass Transfer Conference December 14-17, 2023, IIT Patna, Patna-801106, Bihar, India;2024

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