In situ surface/interface x-ray diffractometer for oxide molecular beam epitaxy-Reference-Cited by-同舟云学术

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In situ surface/interface x-ray diffractometer for oxide molecular beam epitaxy

Published:2016-01 Issue:1 Volume:87 Page:013901
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Rev. Sci. Instrum.

Author:

Lee J. H.¹,Tung I. C.¹²^ORCID,Chang S.-H.³,Bhattacharya A.³,Fong D. D.³,Freeland J. W.¹^ORCID,Hong Hawoong¹

Affiliation:

1. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

2. Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA

3. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA

Funder

U.S. Department of Energy (DOE)

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.4939100

Reference12 articles.

1. Colloquium: Emergent properties in plane view: Strong correlations at oxide interfaces

2. Magnetic Oxide Heterostructures

3. A six-circle diffractometer system for synchrotron X-ray studies of surfaces and thin film growth by molecular beam epitaxy

4. Quantum Beating Patterns Observed in the Energetics of Pb Film Nanostructures

5. Quantum growth of a metal/insulator system: Lead on sapphire

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1. On the Emergence of Ferromagnetism in LaCoO₃ Ultrathin Films;Advanced Functional Materials;2024-07-30

2. Development of in situ characterization techniques in molecular beam epitaxy;Journal of Semiconductors;2024-03-01

3. In situ x-ray studies of growth of complex oxides on graphene by molecular beam epitaxy;APL Materials;2022-09-01

4. Origin of the 2D Electron Gas at the SrTiO ₃ Surface;Advanced Materials;2022-05-16

5. In situ study on the evolution of atomic and electronic structure of LaTiO3/SrTiO3 system;Physical Review Materials;2022-01-14

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