X-ray standing wave microscopy: Chemical microanalysis with atomic resolution-Reference-Cited by-同舟云学术

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X-ray standing wave microscopy: Chemical microanalysis with atomic resolution

Published:2002-09-16 Issue:12 Volume:81 Page:2279-2281
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Drakopoulos Michael,Zegenhagen Jörg,Snigirev Anatoly,Snigireva Irina,Hauser Maik,Eberl Karl,Aristov Vitalii,Shabelnikov Leonid,Yunkin Vecheslav

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1506779

Reference12 articles.

1. Detection of Foreign Atom Sites by Their X-Ray Fluorescence Scattering

2. Detection of Foreign Atom Sites by Their X-Ray Fluorescence Scattering

3. X-Ray standing wave analysis of bismuth implanted in Si(110)

4. X-Ray Standing Waves: A Molecular Yardstick for Biological Membranes

5. Surface structure determination with X-ray standing waves

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1. High-Resolution Soft X-ray Angle-Integrated and -Resolved Photoelectron Spectroscopy of Correlated Electron Systems;Springer Series in Surface Sciences;2021

2. Applications of the X-Ray Standing Wave Technique in Physical Science Research;Synchrotron Light Sources and Free-Electron Lasers;2020

3. X-ray standing waves technique: Fourier imaging active sites;Japanese Journal of Applied Physics;2019-11-01

4. Depth-Dependent Scanning Photoelectron Microspectroscopy Unravels the Mechanism of Dynamic Pattern Formation in Alloy Electrodeposition;The Journal of Physical Chemistry C;2018-06-06

5. Applications of the X-Ray Standing Wave Technique in Physical Science Research;Synchrotron Light Sources and Free-Electron Lasers;2018

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