Effects of bottom electrode conditions on ferroelectric properties of SrBi2Ta2O9 thin films-Reference-Cited by-同舟云学术

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Effects of bottom electrode conditions on ferroelectric properties of SrBi2Ta2O9 thin films

Published:2006-10-15 Issue:8 Volume:100 Page:086106
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Ashikaga Kinya,Inomata Daisuke,Igarashi Yasushi,Takaya Koji,Kanehara Takao,Kumagai Tomoya,Koiwa Ichiro

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2362995

Reference5 articles.

1. Orientation Control ofSr0.7Bi2.3Ta2O9+αThin Films by Chemical Liquid Deposition

2. Dielectric Properties of (111) and (100) Lead-Zirconate-Titanate Films Prepared by Sol-Gel Technique

3. Novel Si Codoped Pb(Zr,Ti,Nb)O3Thin Film for High-Density Ferroelectric Random Access Memory

4. Effect of Annealing Method to Crystalize on Sr0.9Bi2.3Ta2O9+αThin Film Properties Formed from Alkoxide Solution

5. Time and temperature dependencies of imprint characteristics in SrBi2Ta2O9 capacitors

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. First-principles study of spontaneous polarization in SrBi2Ta2O9;Journal of Physics: Condensed Matter;2010-12-06

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