Simultaneous angle‐resolved measurement of the band structure of single‐crystal graphite by an improved two‐dimensional display analyzer

Author:

Nishimoto Hiroyuki,Daimon Hiroshi,Suga Shigemasa,Tezuka Yoshihiro,Ino Shozo,Kato Isao,Zenitani Fukuo,Soezima Hiroyoshi

Publisher

AIP Publishing

Subject

Instrumentation

Cited by 37 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. X-ray photoelectron diffraction (XPED) and X-ray spectro-holography from the contributions of our instruments;Journal of Electron Spectroscopy and Related Phenomena;2022-05

2. Instrumentation and Methodology;Springer Series in Surface Sciences;2021

3. Photoelectron Diffraction and Photoelectron Holography;Springer Series in Surface Sciences;2021

4. Photoelectron Diffraction and Photoelectron Holography;Springer Series in Optical Sciences;2013-09-08

5. Instrumentation and Methodology;Springer Series in Optical Sciences;2013-09-08

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