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2. International Technology Roadmap for Semiconductors: 1999 Edition(Semiconductor Industry Association, Austin, TX, 1999).
3. Crystalline Defects and Contamination: Their Impact and Control in Device Manufacturing, edited by B. O. Kolbesen, C. Claeys, P. Stallhofer, and F. Tardif (Electrochemical Society, Pennington, NJ, 1993), Vol. 93-15.
4. Crystalline Defects and Contamination: Their Impact and Control in Device Manufacturing II, edited by B. O. Kolbesen, P. Stallhofer, C. Claeys, and F. Tardif (Electrochemical Society, Pennington, NJ, 1997), Vol. 97-22.
5. Transition metals in silicon