The vacuum ultraviolet scanning photoelectron microscope at MAX‐LAB
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1145986
Reference10 articles.
1. Energy-filtered imaging with electrostatic optics for photoelectron microscopy
2. An electrostatic microscope for synchrotron radiation x‐ray absorption microspectroscopy (invited)
3. Core level photoelectron microscopy
4. From small-area to imaging photoabsorption spectroscopy
5. Grazing incidence optics for soft x‐ray microscopy
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