In-depth resolved Raman scattering analysis for the identification of secondary phases: Characterization of Cu2ZnSnS4 layers for solar cell applications-Reference-Cited by-同舟云学术

In-depth resolved Raman scattering analysis for the identification of secondary phases: Characterization of Cu2ZnSnS4 layers for solar cell applications

Published:2011-05-02 Issue:18 Volume:98 Page:181905
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Fontané X.,Calvo-Barrio L.,Izquierdo-Roca V.,Saucedo E.,Pérez-Rodriguez A.,Morante J. R.,Berg D. M.,Dale P. J.,Siebentritt S.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3587614

Reference27 articles.

1. Detection of a ZnSe secondary phase in coevaporated Cu2ZnSnSe4 thin films

2. Effects of post-growth annealing on physical properties of SrRuO3 thin film grown by MOCVD

3. Mediating distribution of magnetic Co ions by Cr-codoping in (Co,Cr): ZnO thin films

4. Thermoelectric Properties of Binary Semiconducting Intermetallic Compounds Al₂Ru and Ga₂Ru Synthesized by Spark Plasma Sintering Process

5. Magnetic Anisotropy of Ni-Doped ZnO Nanocrystalline Thin Films

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