Calculation of the electron-optical characteristics of electron beams transmitted into vacuum from a sharp tip-thin foil junction
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.367186
Reference13 articles.
1. Ballistic-electron emission into vacuum from a scanning-tunneling-microscope tip through free-standing gold films
2. Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy
3. Ballistic-electron emission microscopy (BEEM): studies of metal/semiconductor interfaces with nanometer resolution
4. Quantitative study of electron transport in ballistic-electron-emission microscopy
5. Theory and Application for the Scanning Tunneling Microscope
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