A new surface science in situ transmission and reflection electron microscope
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1148679
Reference22 articles.
1. Measurement of Si(111) surface stress by a microscopic technique
2. UHV-TEM-REM Studies of Si(111) Surfaces
3. Progress in the Continuous Observation of Thin-Film Nucleation and Growth Processes by Electron Microscopy
4. CONTINUOUS OBSERVATIONS WITH THE ELECTRON MICROSCOPE ON THE FORMATION OF EVAPORATED FILMS OF SILVER, GOLD, AND TIN
5. Nucleation and Growth of Thin Films as Observed in the Electron Microscope
Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Perspectives on ultra-high vacuum transmission electron microscopy of dynamic crystal growth phenomena;Progress in Materials Science;2023-10
2. Advances in Contemporary Nanosphere Lithographic Techniques;Journal of Nanoscience and Nanotechnology;2006-07-01
3. Structure and shape transformation from multiply twinned particles to epitaxial nanocrystals: Importance of interface on the structure of Ag nanoparticles;Physical Review B;2005-08-16
4. Nanocluster interfaces and epitaxy: Ag on Si surfaces;Zeitschrift für Metallkunde;2005-05
5. Alkanethiol Mediated Release of Surface Bound Nanoparticles Fabricated by Nanosphere Lithography;MRS Proceedings;2005
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3