Temperature-dependent relaxation current on single and dual layer Pt metal nanocrystal-based Al2O3/SiO2gate stack
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4764873
Reference16 articles.
1. Future challenges of flash memory technologies
2. Performance and Reliability Study of Single-Layer and Dual-Layer Platinum Nanocrystal Flash Memory Devices Under NAND Operation
3. Design Optimization of Metal Nanocrystal Memory—Part II: Gate-Stack Engineering
4. P. K. Singh, G. Bisht, M. Sivatheja, C. Sandhya, G. Mukhopadhyay, K. K. Singh, S. Mahapatra, R. Hofmann, and N. Krishna, “ Reliability of single and dual layer Pt nanocrystal devices for NAND flash applications: A 2-region model for endurance defect generation,” inIEEE International Reliability Physics Symposium (IRPS)(IEEE, 2009), pp. 301–306.
5. Dual Layer Pt Metal Nanocrystal Flash for Multi-Level-Cell NAND Application
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