Multi-lateral shearing interferometry: Principle and application to X-ray phase imaging-Reference-Cited by-同舟云学术

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Multi-lateral shearing interferometry: Principle and application to X-ray phase imaging

Published:2012 Issue: Volume: Page:
ISSN:0094-243X
Container-title:AIP Conference Proceedings
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Author:

Primot Jéro^me,Rizzi Julien,Mercère Pascal,Idir Mourad,Bon Pierre,Wattellier Benoit,Druart Guillaume,Vincent Grégory,Haïdar Riad,Weitkamp Timm,Guérineau Nicolas,Monneret Serge

Publisher

AIP

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Calibration method of shear amount based on the optical layout of point source microscope for lateral shearing interferometric wavefront sensor;Optical Engineering;2020-09-26

2. Circular-aperture Modified Hartmann Mask for quadriwave lateral shearing interferometry;Optics Communications;2019-11

3. Analysis of lateral shearing interferometry without self-imaging limitations;Applied Optics;2015-09-14

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