Influence of film thickness on the crystallization of Ni-doped amorphous silicon samples
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2955457
Reference23 articles.
1. Technology and Applications of Amorphous Silicon
2. In-situ X-ray Diffraction study of Metal Induced Crystallization of amorphous silicon
3. Metal-induced nanocrystalline structures in Ni-containing amorphous silicon thin films
4. Study of dynamics and mechanism of metal-induced silicon growth
5. Low-temperature Al-induced crystallization of amorphous Ge
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2. Phase separation within NiSiN coatings during reactive HiPIMS discharges: A new pathway to grow NixSi nanocrystals composites at low temperature;Applied Surface Science;2018-10
3. On the structural-optical properties of Al-containing amorphous Si thin films and the metal-induced crystallization phenomenon;Journal of Applied Physics;2014-08-21
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