Ellipsometric studies on zinc sulfide thin films grown by atomic layer epitaxy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.339642
Reference44 articles.
1. Atomic layer epitaxy
2. X-ray diffraction study of thin electroluminescent ZnS films grown by atomic layer epitaxy
3. Cross-sectional transmission electron microscopy of electroluminescent thin films fabricated by various deposition methods
4. Comparative study of the crystal phase, crystallite size and microstrain in electroluminescent ZnS:Mn films grown by atomic layer epitaxy and electron beam evaporation
5. Effect of growth temperature on the electronic energy band and crystal structure of ZnS thin films grown using atomic layer epitaxy
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1. Atomic Layer Deposition an Innovative Technology to Improve Corrosion and Surface Functionalities of Alloys;Encyclopedia of Interfacial Chemistry;2018
2. Crystallinity of inorganic films grown by atomic layer deposition: Overview and general trends;Journal of Applied Physics;2013-01-14
3. Characterization of chemical bath deposited buffer layers for thin film solar cell applications;physica status solidi (a);2010-06-29
4. Surface chemistry of atomic layer deposition: A case study for the trimethylaluminum/water process;Journal of Applied Physics;2005-06-15
5. Optical constants of zinc sulfide films determined from transmittance measurements;Thin Solid Films;2000-12
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