An Introduction to the Helium Ion Microscope-Reference-Cited by-同舟云学术

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An Introduction to the Helium Ion Microscope

Published:2007 Issue: Volume: Page:
ISSN:0094-243X
Container-title:AIP Conference Proceedings
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Author:

Notte John,Ward Bill,Economou Nick,Hill Ray,Percival Randy,Farkas Lou,McVey Shawn,Seiler David G.,Diebold Alain C.,McDonald Robert,Garner C. Michael,Herr Dan,Khosla Rajinder P.,Secula Erik M.

Publisher

AIP

Cited by 47 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Rewritable printing of ionic liquid nanofilm utilizing focused ion beam induced film wetting;Nature Communications;2024-04-05

2. Helium Focused Ion Beam Damage in Silicon: Physics-Informed Neural Network Modeling of Helium Bubble Nucleation and Early Growth;2024

3. Helium Focused Ion Beam Damage in Silicon: Physics-Informed Neural Network Modeling of Helium Bubble Nucleation and Early Growth;2024

4. Characterization techniques of surface-modified or functionalized nanofillers;Advances in Functionalized Polymer Nanocomposites;2024

5. Nanoscale imaging of major and minor ampullate silk from the orb-web spider Nephila Madagascariensis;Scientific Reports;2023-04-24

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